Investigation of the Electron Transfer at Si Electrodes: Impact and Removal of the Native SiO2 Layer

Heinz Bülter, Michael Sternad, Eduardo dos Santos Sardinha, Julia Witt, Carsten Dosche, Martin Wilkening, Gunther Wittstock

Research output: Contribution to journalArticleResearchpeer-review

Original languageGerman
Pages (from-to)A504-A512
JournalJournal of the Electrochemical Society
Volume163
Issue number3
DOIs
Publication statusPublished - 2016

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

Investigation of the Electron Transfer at Si Electrodes: Impact and Removal of the Native SiO2 Layer. / Bülter, Heinz; Sternad, Michael; dos Santos Sardinha, Eduardo; Witt, Julia; Dosche, Carsten; Wilkening, Martin; Wittstock, Gunther.

In: Journal of the Electrochemical Society, Vol. 163, No. 3, 2016, p. A504-A512.

Research output: Contribution to journalArticleResearchpeer-review

Bülter, Heinz ; Sternad, Michael ; dos Santos Sardinha, Eduardo ; Witt, Julia ; Dosche, Carsten ; Wilkening, Martin ; Wittstock, Gunther. / Investigation of the Electron Transfer at Si Electrodes: Impact and Removal of the Native SiO2 Layer. In: Journal of the Electrochemical Society. 2016 ; Vol. 163, No. 3. pp. A504-A512.
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AU - Wilkening, Martin

AU - Wittstock, Gunther

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