Investigation of Strained Silicon by Raman-Microscopy

Brigitte Patsch, Ernst Lankmayr

Research output: Contribution to conference › Poster

Original languageEnglish
Publication statusPublished - 2005
EventInternational Symposium on Instrumental Analysis - Graz, Austria
Duration: 25 Sept 2005 → 28 Sept 2005

Conference

ConferenceInternational Symposium on Instrumental Analysis
Country/TerritoryAustria
CityGraz
Period25/09/05 → 28/09/05

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

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