Investigation of Strained Silicon by Raman-Microscopy

Brigitte Patsch, Ernst Lankmayr

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2005
EventInternational Symposium on Instrumental Analysis - Graz, Austria
Duration: 25 Sep 200528 Sep 2005

Conference

ConferenceInternational Symposium on Instrumental Analysis
CountryAustria
CityGraz
Period25/09/0528/09/05

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Patsch, B., & Lankmayr, E. (2005). Investigation of Strained Silicon by Raman-Microscopy. Poster session presented at International Symposium on Instrumental Analysis, Graz, Austria.

Investigation of Strained Silicon by Raman-Microscopy. / Patsch, Brigitte; Lankmayr, Ernst.

2005. Poster session presented at International Symposium on Instrumental Analysis, Graz, Austria.

Research output: Contribution to conferencePosterResearch

Patsch, B & Lankmayr, E 2005, 'Investigation of Strained Silicon by Raman-Microscopy' International Symposium on Instrumental Analysis, Graz, Austria, 25/09/05 - 28/09/05, .
Patsch B, Lankmayr E. Investigation of Strained Silicon by Raman-Microscopy. 2005. Poster session presented at International Symposium on Instrumental Analysis, Graz, Austria.
Patsch, Brigitte ; Lankmayr, Ernst. / Investigation of Strained Silicon by Raman-Microscopy. Poster session presented at International Symposium on Instrumental Analysis, Graz, Austria.
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title = "Investigation of Strained Silicon by Raman-Microscopy",
author = "Brigitte Patsch and Ernst Lankmayr",
year = "2005",
language = "English",
note = "International Symposium on Instrumental Analysis ; Conference date: 25-09-2005 Through 28-09-2005",

}

TY - CONF

T1 - Investigation of Strained Silicon by Raman-Microscopy

AU - Patsch, Brigitte

AU - Lankmayr, Ernst

PY - 2005

Y1 - 2005

M3 - Poster

ER -