Investigation of performance limiting point defects at semiconductor-oxide interfaces using electrically detected magnetic resonance

Gernot Gruber, Markus Koch, Peter Hadley

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Original languageEnglish
Title of host publication64. Jahrestagung der Österreichischen Physikalischen Gesellschaft / Echophysics-Pöllau
Publisher.
Pages12-12
Publication statusPublished - 2014
EventJahrestagung der Österreichischen Physikalischen Gesellschaft - Pöllau, Austria
Duration: 24 Sep 201427 Sep 2014

Conference

ConferenceJahrestagung der Österreichischen Physikalischen Gesellschaft
CountryAustria
CityPöllau
Period24/09/1427/09/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Gruber, G., Koch, M., & Hadley, P. (2014). Investigation of performance limiting point defects at semiconductor-oxide interfaces using electrically detected magnetic resonance. In 64. Jahrestagung der Österreichischen Physikalischen Gesellschaft / Echophysics-Pöllau (pp. 12-12). ..

Investigation of performance limiting point defects at semiconductor-oxide interfaces using electrically detected magnetic resonance. / Gruber, Gernot; Koch, Markus; Hadley, Peter.

64. Jahrestagung der Österreichischen Physikalischen Gesellschaft / Echophysics-Pöllau. ., 2014. p. 12-12.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Gruber, G, Koch, M & Hadley, P 2014, Investigation of performance limiting point defects at semiconductor-oxide interfaces using electrically detected magnetic resonance. in 64. Jahrestagung der Österreichischen Physikalischen Gesellschaft / Echophysics-Pöllau. ., pp. 12-12, Jahrestagung der Österreichischen Physikalischen Gesellschaft, Pöllau, Austria, 24/09/14.
Gruber G, Koch M, Hadley P. Investigation of performance limiting point defects at semiconductor-oxide interfaces using electrically detected magnetic resonance. In 64. Jahrestagung der Österreichischen Physikalischen Gesellschaft / Echophysics-Pöllau. . 2014. p. 12-12
Gruber, Gernot ; Koch, Markus ; Hadley, Peter. / Investigation of performance limiting point defects at semiconductor-oxide interfaces using electrically detected magnetic resonance. 64. Jahrestagung der Österreichischen Physikalischen Gesellschaft / Echophysics-Pöllau. ., 2014. pp. 12-12
@inproceedings{08e3da753975467eac60a5a46afc9c32,
title = "Investigation of performance limiting point defects at semiconductor-oxide interfaces using electrically detected magnetic resonance",
author = "Gernot Gruber and Markus Koch and Peter Hadley",
year = "2014",
language = "English",
pages = "12--12",
booktitle = "64. Jahrestagung der {\"O}sterreichischen Physikalischen Gesellschaft / Echophysics-P{\"o}llau",
publisher = ".",

}

TY - GEN

T1 - Investigation of performance limiting point defects at semiconductor-oxide interfaces using electrically detected magnetic resonance

AU - Gruber, Gernot

AU - Koch, Markus

AU - Hadley, Peter

PY - 2014

Y1 - 2014

M3 - Conference contribution

SP - 12

EP - 12

BT - 64. Jahrestagung der Österreichischen Physikalischen Gesellschaft / Echophysics-Pöllau

PB - .

ER -