Investigation of noise coupling from switching power supply to signal nets

Songping Wu*, Keong Kam, David Pommerenke, Bill Cornelius, Hao Shi, Matthew Herndon, Jun Fan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Noise coupled from switched-mode power supply to signal nets can cause severe signal integrity problems because of the existence of fast switching voltages and currents in the circuit. In this paper, noise coupling mechanism from a synchronous buck converter to a nearby signal trace is studied using a hybrid non-linear model, which combines the synchronous buck converter circuit model and the passive electromagnetic model of the PCB coupling. General design guidelines to mitigate the noise coupling in practical printed circuit board (PCB) designs are provided based on the modeling results.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Pages79-84
Number of pages6
DOIs
Publication statusPublished - 1 Dec 2010
Externally publishedYes
Event2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Fort Lauderdale, FL, United States
Duration: 25 Jul 201030 Jul 2010

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Conference

Conference2010 IEEE International Symposium on Electromagnetic Compatibility, EMC 2010
CountryUnited States
CityFort Lauderdale, FL
Period25/07/1030/07/10

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Wu, S., Kam, K., Pommerenke, D., Cornelius, B., Shi, H., Herndon, M., & Fan, J. (2010). Investigation of noise coupling from switching power supply to signal nets. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program (pp. 79-84). [5711251] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2010.5711251