Interface structure studies by atomic resolution microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids

H.-E. Schaefer, K. Reimann, W. Straub, F. Phillipp, H. Tanimoto, Ulrich Brossmann, Roland Würschum

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)24-33
JournalMaterials science and engineering / B
Volume286
Publication statusPublished - 2000

Fields of Expertise

  • Advanced Materials Science

Cite this

Interface structure studies by atomic resolution microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids. / Schaefer, H.-E.; Reimann, K.; Straub, W.; Phillipp, F.; Tanimoto, H.; Brossmann, Ulrich; Würschum, Roland.

In: Materials science and engineering / B, Vol. 286, 2000, p. 24-33.

Research output: Contribution to journalArticleResearchpeer-review

@article{d431f7db315b410ea07280a3688d770d,
title = "Interface structure studies by atomic resolution microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids",
author = "H.-E. Schaefer and K. Reimann and W. Straub and F. Phillipp and H. Tanimoto and Ulrich Brossmann and Roland W{\"u}rschum",
year = "2000",
language = "English",
volume = "286",
pages = "24--33",
journal = "Materials science and engineering / B",
issn = "0921-5107",
publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Interface structure studies by atomic resolution microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids

AU - Schaefer, H.-E.

AU - Reimann, K.

AU - Straub, W.

AU - Phillipp, F.

AU - Tanimoto, H.

AU - Brossmann, Ulrich

AU - Würschum, Roland

PY - 2000

Y1 - 2000

M3 - Article

VL - 286

SP - 24

EP - 33

JO - Materials science and engineering / B

JF - Materials science and engineering / B

SN - 0921-5107

ER -