Interface defects in SiC power MOSFETs - An electrically detected magnetic resonance study based on spin dependent recombination

Gernot Gruber, Markus Koch, Peter Hadley, Dethard Peters, Thomas Aichinger

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)165-168
JournalAIP Conference Proceedings
Volume1583
DOIs
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Experimental

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