Interactive Visual Exploration of defect prediction in industrial setting through explainable models based on SHAP values

Milot Gashi, Belgin Mutlu, Josef Suschnigg, Patrick Ofner, Stefan Pichler, Tobias Schreck

Research output: Contribution to conferencePosterpeer-review

Original languageEnglish
Publication statusPublished - 2020
EventIEEE VIS 2020 - Virtuell, United States
Duration: 25 Oct 202030 Oct 2020
http://ieeevis.org/year/2020/welcome

Conference

ConferenceIEEE VIS 2020
Abbreviated titleVIS 2020
CountryUnited States
CityVirtuell
Period25/10/2030/10/20
Internet address

Fields of Expertise

  • Information, Communication & Computing

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