Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle.

Rudolf Stollberger, Paul Wach, Ch. Leussler, E. Justich

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProc. SMRM (Works in Progress), 8th Meeting
Publisher.
Pages1165-1165
Publication statusPublished - 1989

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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