Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle

Rudolf Stollberger, Paul Wach, C. Leussler, E. Justich

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 1989
Event8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine - Amsterdam
Duration: 12 Aug 198918 Aug 1989

Conference

Conference8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine
CityAmsterdam
Period12/08/8918/08/89

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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