Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle

Research output: Contribution to conference › Poster › Research

Original language	English
Publication status	Published - 1989
Event	8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine - Amsterdam Duration: 12 Aug 1989 → 18 Aug 1989

Conference	8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine
City	Amsterdam
Period	12/08/89 → 18/08/89

Stollberger, R., Wach, P., Leussler, C., & Justich, E. (1989). Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle. Poster session presented at 8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine, Amsterdam, .

1989. Poster session presented at 8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine, Amsterdam, .

Research output: Contribution to conference › Poster › Research

@conference{054d8c49bab74ee2bb9287bcaa412015,

title = "Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle",

author = "Rudolf Stollberger and Paul Wach and C. Leussler and E. Justich",

year = "1989",

language = "English",

note = "8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine ; Conference date: 12-08-1989 Through 18-08-1989",

}