Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle

Rudolf Stollberger; Paul Wach; C. Leussler; E. Justich

Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle

Rudolf Stollberger, Paul Wach, C. Leussler, E. Justich

Institute of Biomedical Imaging (7170)

Research output: Contribution to conference › Poster

Original language	English
Publication status	Published - 1989
Event	8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine: SMRM 1989 - Amsterdam, Netherlands Duration: 12 Aug 1989 → 18 Aug 1989

Conference

Conference	8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine
Country/Territory	Netherlands
City	Amsterdam
Period	12/08/89 → 18/08/89

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Cite this

@conference{054d8c49bab74ee2bb9287bcaa412015,

title = "Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle",

author = "Rudolf Stollberger and Paul Wach and C. Leussler and E. Justich",

year = "1989",

language = "English",

note = "8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine : SMRM 1989 ; Conference date: 12-08-1989 Through 18-08-1989",

}

TY - CONF

T1 - Intensity artefacts due to RF eddy and displacement currents and their dependence on setting of the flip angle

AU - Stollberger, Rudolf

AU - Wach, Paul

AU - Leussler, C.

AU - Justich, E.

PY - 1989

Y1 - 1989

M3 - Poster

T2 - 8th Annual Scientific Meeting and Exhibition Society of Magnetic Resonance in Medicine

Y2 - 12 August 1989 through 18 August 1989

ER -