Insights into analysis operator learning: From patch-based sparse models to higher-order MRFs

Yunjin Chen, Rene Ranftl, Thomas Pock

Research output: Contribution to journalArticleResearchpeer-review

LanguageEnglish
Pages1060-1072
JournalIEEE transactions on image processing
Volume99
Issue number1
StatusPublished - 2014

Fields of Expertise

  • Information, Communication & Computing

Cite this

Insights into analysis operator learning: From patch-based sparse models to higher-order MRFs. / Chen, Yunjin; Ranftl, Rene; Pock, Thomas.

In: IEEE transactions on image processing, Vol. 99, No. 1, 2014, p. 1060-1072.

Research output: Contribution to journalArticleResearchpeer-review

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