Insights into analysis operator learning: From patch-based sparse models to higher-order MRFs

Yunjin Chen, Rene Ranftl, Thomas Pock

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	1060-1072
Journal	IEEE transactions on image processing
Volume	99
Issue number	1
Publication status	Published - 2014

Fields of Expertise

@article{d8a0ea58e80f4da8be4f25963f87895e,

title = "Insights into analysis operator learning: From patch-based sparse models to higher-order MRFs",

author = "Yunjin Chen and Rene Ranftl and Thomas Pock",

year = "2014",

language = "English",

volume = "99",

pages = "1060--1072",

journal = "IEEE transactions on image processing",

issn = "1057-7149",

publisher = "Institute of Electrical and Electronics Engineers",

number = "1",

}