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Dive into the research topics of 'Influence of oxide processing on the defects at the SiC-SiO2 interface measured by electrically detected magnetic resonance'. Together they form a unique fingerprint.- Sort by
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Gernot Gruber*, Thomas Aichinger, Gregor Pobegen, Dethard Peters, Markus Koch, Peter Hadley
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review