Incremental Model-based Mutation Testing

Stefan Tiran

doi:10.1109/ICST.2015.7102614

Incremental Model-based Mutation Testing

Stefan Tiran

Institute of Software Technology (7160)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	IEEE International Conference on Software Testing, Verification and Validation
Publisher	.
Pages	1-2
DOIs	https://doi.org/10.1109/ICST.2015.7102614
Publication status	Published - 2015
Event	8th IEEE International Conference on Software Testing, Verification and Validation: ICST 2015 - Graz, Austria Duration: 13 Apr 2015 → 17 Apr 2015

Conference

Conference	8th IEEE International Conference on Software Testing, Verification and Validation
Country/Territory	Austria
City	Graz
Period	13/04/15 → 17/04/15

Fields of Expertise

Information, Communication & Computing

Access to Document

10.1109/ICST.2015.7102614

Cite this

@inproceedings{941399858fe248d4abd23184dbc69d2b,

title = "Incremental Model-based Mutation Testing",

author = "Stefan Tiran",

year = "2015",

doi = "10.1109/ICST.2015.7102614",

language = "English",

pages = "1--2",

booktitle = "IEEE International Conference on Software Testing, Verification and Validation",

publisher = ".",

note = "8th IEEE International Conference on Software Testing, Verification and Validation : ICST 2015 ; Conference date: 13-04-2015 Through 17-04-2015",

}

TY - GEN

T1 - Incremental Model-based Mutation Testing

AU - Tiran, Stefan

PY - 2015

Y1 - 2015

UR - http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7102614&tag=1

U2 - 10.1109/ICST.2015.7102614

DO - 10.1109/ICST.2015.7102614

M3 - Conference paper

SP - 1

EP - 2

BT - IEEE International Conference on Software Testing, Verification and Validation

PB - .

T2 - 8th IEEE International Conference on Software Testing, Verification and Validation

Y2 - 13 April 2015 through 17 April 2015

ER -

Incremental Model-based Mutation Testing

Conference

Fields of Expertise

Access to Document

Other files and links

CRYSTAL - Critical Systems Engineering Factories

Cite this

Incremental Model-based Mutation Testing

Conference

Fields of Expertise

Access to Document

Other files and links

Projects

CRYSTAL - Critical Systems Engineering Factories

Cite this