In-situ XRD and FIB microscopy studies of the dynamics of intermetallic phase formation in thin layer Cu/Sn films for low-temperature isothermal diffusion soldering

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMRS Proceedings
Publisher.
Pagesmrs10-131-0
DOIs
Publication statusPublished - 2011

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

In-situ XRD and FIB microscopy studies of the dynamics of intermetallic phase formation in thin layer Cu/Sn films for low-temperature isothermal diffusion soldering. / Hadley, Peter.

MRS Proceedings. ., 2011. p. mrs10-131-0.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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DO - 10.1557/opl.2011.268

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