In-situ X-ray characterisation of voltage induced changes in organic semiconductors

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Souren Grigorian, Linda Grodd, Ulrich Pietsch, Roland Resel

Research output: Contribution to conferencePosterResearch

Original languageGerman
Publication statusPublished - 2010
EventISOTEC Meeting 2010 - Reinischkogel
Duration: 25 Nov 201026 Nov 2010

Conference

ConferenceISOTEC Meeting 2010
CityReinischkogel
Period25/11/1026/11/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Cite this

Neuhold, A., Novak, J., Flesch, H-G., Grigorian, S., Grodd, L., Pietsch, U., & Resel, R. (2010). In-situ X-ray characterisation of voltage induced changes in organic semiconductors. Poster session presented at ISOTEC Meeting 2010, Reinischkogel, .