In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method

R.N. Viswanath, J. Weißmüller, Roland Würschum, H. Gleiter

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the Internat. Conf. on Advances in Materials and Materials Processing
    PublisherTata McGraw-Hill Publ.
    Pages897-901
    Publication statusPublished - 2002

    Cite this

    Viswanath, R. N., Weißmüller, J., Würschum, R., & Gleiter, H. (2002). In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method. In Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing (pp. 897-901). Tata McGraw-Hill Publ..

    In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method. / Viswanath, R.N.; Weißmüller, J.; Würschum, Roland; Gleiter, H.

    Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing. Tata McGraw-Hill Publ., 2002. p. 897-901.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

    Viswanath, RN, Weißmüller, J, Würschum, R & Gleiter, H 2002, In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method. in Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing. Tata McGraw-Hill Publ., pp. 897-901.
    Viswanath RN, Weißmüller J, Würschum R, Gleiter H. In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method. In Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing. Tata McGraw-Hill Publ. 2002. p. 897-901
    Viswanath, R.N. ; Weißmüller, J. ; Würschum, Roland ; Gleiter, H. / In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method. Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing. Tata McGraw-Hill Publ., 2002. pp. 897-901
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    title = "In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method",
    author = "R.N. Viswanath and J. Wei{\ss}m{\"u}ller and Roland W{\"u}rschum and H. Gleiter",
    year = "2002",
    language = "English",
    pages = "897--901",
    booktitle = "Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing",
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    AU - Viswanath, R.N.

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    AU - Würschum, Roland

    AU - Gleiter, H.

    PY - 2002

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    BT - Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing

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