In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method

R.N. Viswanath, J. Weißmüller, Roland Würschum, H. Gleiter

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing
Publisher	Tata McGraw-Hill Publ.
Pages	897-901
Publication status	Published - 2002

Cite this

In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method. / Viswanath, R.N.; Weißmüller, J.; Würschum, Roland et al.
Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing. Tata McGraw-Hill Publ., 2002. p. 897-901.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

@inproceedings{40098d1941114471807d05007f3b85e0,

title = "In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method",

author = "R.N. Viswanath and J. Wei{\ss}m{\"u}ller and Roland W{\"u}rschum and H. Gleiter",

year = "2002",

language = "English",

pages = "897--901",

booktitle = "Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing",

publisher = "Tata McGraw-Hill Publ.",

}