In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method

R.N. Viswanath, J. Weißmüller, Roland Würschum, H. Gleiter

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationProceedings of the Internat. Conf. on Advances in Materials and Materials Processing
    PublisherTata McGraw-Hill Publ.
    Pages897-901
    Publication statusPublished - 2002

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    Viswanath, R. N., Weißmüller, J., Würschum, R., & Gleiter, H. (2002). In-situ study of nanocystalline Pt-KOH (1M) interface using x-ray diffraction method. In Proceedings of the Internat. Conf. on Advances in Materials and Materials Processing (pp. 897-901). Tata McGraw-Hill Publ..