In situ preparation, electrical and surface analytical characterisation of pentacene thin film transistors

Roman Lassnig, Bernd Striedinger, Michael Hollerer, Alexander Fian, Barbara Stadlober, Adolf Winkler

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)114508-1-114508-11
JournalJournal of Applied Physics
Volume116
DOIs
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

In situ preparation, electrical and surface analytical characterisation of pentacene thin film transistors. / Lassnig, Roman; Striedinger, Bernd; Hollerer, Michael; Fian, Alexander; Stadlober, Barbara; Winkler, Adolf.

In: Journal of Applied Physics, Vol. 116, 2014, p. 114508-1-114508-11.

Research output: Contribution to journalArticleResearchpeer-review

Lassnig, Roman ; Striedinger, Bernd ; Hollerer, Michael ; Fian, Alexander ; Stadlober, Barbara ; Winkler, Adolf. / In situ preparation, electrical and surface analytical characterisation of pentacene thin film transistors. In: Journal of Applied Physics. 2014 ; Vol. 116. pp. 114508-1-114508-11.
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AU - Stadlober, Barbara

AU - Winkler, Adolf

PY - 2014

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