| Original language | English |
|---|---|
| Pages (from-to) | 114508-1-114508-11 |
| Journal | Journal of Applied Physics |
| Volume | 116 |
| DOIs | |
| Publication status | Published - 2014 |
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)
- Experimental
Cite this
In situ preparation, electrical and surface analytical characterisation of pentacene thin film transistors. / Lassnig, Roman; Striedinger, Bernd; Hollerer, Michael; Fian, Alexander; Stadlober, Barbara; Winkler, Adolf.
In: Journal of Applied Physics, Vol. 116, 2014, p. 114508-1-114508-11.Research output: Contribution to journal › Article › Research › peer-review
}
TY - JOUR
T1 - In situ preparation, electrical and surface analytical characterisation of pentacene thin film transistors
AU - Lassnig, Roman
AU - Striedinger, Bernd
AU - Hollerer, Michael
AU - Fian, Alexander
AU - Stadlober, Barbara
AU - Winkler, Adolf
PY - 2014
Y1 - 2014
UR - http://dx.doi.org/10.1063/1.4895992
U2 - 10.1063/1.4895992
DO - 10.1063/1.4895992
M3 - Article
VL - 116
SP - 114508-1-114508-11
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
ER -