In situ nanoscale characterisation of electrical and magnetic properties of 3D nanostructures by combination of AFM, SEM and FIB

C. Schwalb, Johanna Hütner, H. Frerichs, M. Wolff, G. Fantner, Harald Plank

Research output: Contribution to conferenceAbstract

Original languageGerman
Pages515-516
Number of pages2
Publication statusPublished - 2021
Event2021 Microscopy Conference: MC 2021 - Virtuell, Austria
Duration: 22 Aug 202126 Aug 2021

Conference

Conference2021 Microscopy Conference
Abbreviated titleMC 2021
Country/TerritoryAustria
CityVirtuell
Period22/08/2126/08/21

ASJC Scopus subject areas

  • General Materials Science

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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