In-situ Correlative Analysis of Electrical and Mechanical Properties of 3D Nanostructures by Combination of AFM, SEM and FIB

C. Schwalb, Pinar Frank, Stefan Hummel, Jürgen Sattelkow, Robert Winkler, Johanna Hütner, G.E. Fantner, Harald Plank

Research output: Contribution to journalComment/debate

Original languageEnglish
Pages (from-to)1800-1801
Number of pages2
JournalMicroscopy and Microanalysis
Volume26
Issue numberS2
DOIs
Publication statusPublished - 30 Jul 2020

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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