Improving The Reliability of The Multiline TRL Calibration Algorithm

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Abstract

This paper presents an updated version of the multiline Thru-Reflect-Line (mTRL) calibration algorithm. The proposed approach formulates the calibration problem in a single eigenvalue problem, in which all line standards are combined using an optimally derived weighting matrix. This approach eliminates the need for common line selection and line pairing procedures, as documented in MultiCal [1], [2]. Using on-wafer measurements up to 150 GHz and sensitivity analysis based on the Monte Carlo method, we show that this new approach outperforms the MultiCal implementation and delivers consistent results in the presence of additive noise and phase error.
Original languageEnglish
Title of host publication98th ARFTG Microwave Measurement Conference
Subtitle of host publicationNon-Linear Methods and Measurements for RF and mm-Wave, ARFTG 2022
PublisherACM/IEEE
Pages1-5
Number of pages5
ISBN (Electronic)9781665406628
ISBN (Print)978-1-6654-0663-5
DOIs
Publication statusPublished - 18 Jan 2022
Event98th ARFTG Microwave Measurement Conference: Non-Linear Methods and Measurements for RF and mm-Wave: ARFTG 2022 - Ceaser Palace Hotel and Virtual over Zoom, Las Vegas, United States
Duration: 17 Jan 202218 Jan 2022
Conference number: 98
https://www.arftg.org/

Publication series

Name98th ARFTG Microwave Measurement Conference: Non-Linear Methods and Measurements for RF and mm-Wave, ARFTG 2022

Conference

Conference98th ARFTG Microwave Measurement Conference: Non-Linear Methods and Measurements for RF and mm-Wave
Abbreviated titleARFTG 2022
Country/TerritoryUnited States
CityLas Vegas
Period17/01/2218/01/22
Internet address

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering
  • Signal Processing

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Experimental

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