Improving Classification Performance of RFID Gates using Hidden Markov Models

Michael Goller, Markus Brandner

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	IEEE Instrumentation and Measurement Technology Conference
Publisher	.
Publication status	Accepted/In press - 2011
Event	IEEE Instrumentation and Measurement Technology Conference - Binjiang, Hangzhou, China Duration: 10 May 2011 → 12 May 2011

Conference	IEEE Instrumentation and Measurement Technology Conference
Country/Territory	China
City	Binjiang, Hangzhou
Period	10/05/11 → 12/05/11

Fields of Expertise

@inproceedings{72610d9a7e67424981173d0a13e31955,

title = "Improving Classification Performance of RFID Gates using Hidden Markov Models",

author = "Michael Goller and Markus Brandner",

year = "2011",

language = "English",

booktitle = "IEEE Instrumentation and Measurement Technology Conference",

publisher = ".",

note = "IEEE Instrumentation and Measurement Technology Conference ; Conference date: 10-05-2011 Through 12-05-2011",

}