Improving Classification Performance of RFID Gates using Hidden Markov Models

Michael Goller, Markus Brandner

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationIEEE Instrumentation and Measurement Technology Conference
    Publisher.
    Publication statusAccepted/In press - 2011
    EventIEEE Instrumentation and Measurement Technology Conference - Binjiang, Hangzhou, China
    Duration: 10 May 201112 May 2011

    Conference

    ConferenceIEEE Instrumentation and Measurement Technology Conference
    CountryChina
    CityBinjiang, Hangzhou
    Period10/05/1112/05/11

    Fields of Expertise

    • Information, Communication & Computing

    Treatment code (Nähere Zuordnung)

    • Theoretical
    • Experimental

    Cite this

    Goller, M., & Brandner, M. (Accepted/In press). Improving Classification Performance of RFID Gates using Hidden Markov Models. In IEEE Instrumentation and Measurement Technology Conference ..