Improvements in characterisation of interfaces in solid-state devices

Bernhard Schaffer, Christoph Mitterbauer, Ferdinand Hofer, Egbert Zojer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Original languageEnglish
Title of host publicationSFB-Seminar
Publisher.
Pages1-1
Publication statusPublished - 2002

Cite this

Schaffer, B., Mitterbauer, C., Hofer, F., & Zojer, E. (2002). Improvements in characterisation of interfaces in solid-state devices. In SFB-Seminar (pp. 1-1). ..

Improvements in characterisation of interfaces in solid-state devices. / Schaffer, Bernhard; Mitterbauer, Christoph; Hofer, Ferdinand; Zojer, Egbert.

SFB-Seminar. ., 2002. p. 1-1.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Schaffer, B, Mitterbauer, C, Hofer, F & Zojer, E 2002, Improvements in characterisation of interfaces in solid-state devices. in SFB-Seminar. ., pp. 1-1.
Schaffer B, Mitterbauer C, Hofer F, Zojer E. Improvements in characterisation of interfaces in solid-state devices. In SFB-Seminar. . 2002. p. 1-1
Schaffer, Bernhard ; Mitterbauer, Christoph ; Hofer, Ferdinand ; Zojer, Egbert. / Improvements in characterisation of interfaces in solid-state devices. SFB-Seminar. ., 2002. pp. 1-1
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