Impact of the capacitance of the dielectric on the contact resistance in organic transistors

Karin Zojer, Egbert Zojer, Anton Fernandez Fernandez, Manfred Gruber

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)044002-ff
JournalPhysical review applied
Volume4
DOIs
Publication statusPublished - 2015

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Theoretical
  • Basic - Fundamental (Grundlagenforschung)

Cite this

Impact of the capacitance of the dielectric on the contact resistance in organic transistors. / Zojer, Karin; Zojer, Egbert; Fernandez Fernandez, Anton; Gruber, Manfred.

In: Physical review applied, Vol. 4, 2015, p. 044002-ff.

Research output: Contribution to journalArticleResearchpeer-review

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volume = "4",
pages = "044002--ff",
journal = "Physical review applied",
issn = "2331-7019",
publisher = "American Physical Society",

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AU - Zojer, Egbert

AU - Fernandez Fernandez, Anton

AU - Gruber, Manfred

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PY - 2015

Y1 - 2015

U2 - 10.1103/PhysRevApplied.4.044002

DO - 10.1103/PhysRevApplied.4.044002

M3 - Article

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JO - Physical review applied

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SN - 2331-7019

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