| Original language | English |
|---|---|
| Pages (from-to) | 044002-ff |
| Journal | Physical review applied |
| Volume | 4 |
| DOIs | |
| Publication status | Published - 2015 |
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Theoretical
- Basic - Fundamental (Grundlagenforschung)
Cite this
Zojer, K., Zojer, E., Fernandez Fernandez, A., & Gruber, M. (2015). Impact of the capacitance of the dielectric on the contact resistance in organic transistors. Physical review applied, 4, 044002-ff. https://doi.org/10.1103/PhysRevApplied.4.044002
Impact of the capacitance of the dielectric on the contact resistance in organic transistors. / Zojer, Karin; Zojer, Egbert; Fernandez Fernandez, Anton; Gruber, Manfred.
In: Physical review applied, Vol. 4, 2015, p. 044002-ff.Research output: Contribution to journal › Article › Research › peer-review
Zojer, K, Zojer, E, Fernandez Fernandez, A & Gruber, M 2015, 'Impact of the capacitance of the dielectric on the contact resistance in organic transistors' Physical review applied, vol. 4, pp. 044002-ff. https://doi.org/10.1103/PhysRevApplied.4.044002
Zojer K, Zojer E, Fernandez Fernandez A, Gruber M. Impact of the capacitance of the dielectric on the contact resistance in organic transistors. Physical review applied. 2015;4:044002-ff. https://doi.org/10.1103/PhysRevApplied.4.044002
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title = "Impact of the capacitance of the dielectric on the contact resistance in organic transistors",
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T1 - Impact of the capacitance of the dielectric on the contact resistance in organic transistors
AU - Zojer, Karin
AU - Zojer, Egbert
AU - Fernandez Fernandez, Anton
AU - Gruber, Manfred
N1 - 044002
PY - 2015
Y1 - 2015
U2 - 10.1103/PhysRevApplied.4.044002
DO - 10.1103/PhysRevApplied.4.044002
M3 - Article
VL - 4
SP - 044002-ff
JO - Physical review applied
JF - Physical review applied
SN - 2331-7019
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