Impact of Leakage Effects in Electrical Capacitance Tomography due to Short Electrode Length

Hubert Zangl, Markus Neumayer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationWhat Where When Multi-dimensional Advances for Industrial Process Monitoring
Publisher.
Pages129-138
Publication statusPublished - 2009

Cite this

Zangl, H., & Neumayer, M. (2009). Impact of Leakage Effects in Electrical Capacitance Tomography due to Short Electrode Length. In What Where When Multi-dimensional Advances for Industrial Process Monitoring (pp. 129-138). ..

Impact of Leakage Effects in Electrical Capacitance Tomography due to Short Electrode Length. / Zangl, Hubert; Neumayer, Markus.

What Where When Multi-dimensional Advances for Industrial Process Monitoring. ., 2009. p. 129-138.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Zangl, H & Neumayer, M 2009, Impact of Leakage Effects in Electrical Capacitance Tomography due to Short Electrode Length. in What Where When Multi-dimensional Advances for Industrial Process Monitoring. ., pp. 129-138.
Zangl H, Neumayer M. Impact of Leakage Effects in Electrical Capacitance Tomography due to Short Electrode Length. In What Where When Multi-dimensional Advances for Industrial Process Monitoring. . 2009. p. 129-138
Zangl, Hubert ; Neumayer, Markus. / Impact of Leakage Effects in Electrical Capacitance Tomography due to Short Electrode Length. What Where When Multi-dimensional Advances for Industrial Process Monitoring. ., 2009. pp. 129-138
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