Imaging with neutral atoms using a single crystal silicon wafer

Katrin Fladischer, Wolfgang Ernst, Herbert Reingruber, Bodil Holst

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society
Publisher.
Pages58-58
Publication statusPublished - 2008

Fields of Expertise

  • Advanced Materials Science

Cite this

Fladischer, K., Ernst, W., Reingruber, H., & Holst, B. (2008). Imaging with neutral atoms using a single crystal silicon wafer. In 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society (pp. 58-58). ..

Imaging with neutral atoms using a single crystal silicon wafer. / Fladischer, Katrin; Ernst, Wolfgang; Reingruber, Herbert; Holst, Bodil.

12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society. ., 2008. p. 58-58.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Fladischer, K, Ernst, W, Reingruber, H & Holst, B 2008, Imaging with neutral atoms using a single crystal silicon wafer. in 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society. ., pp. 58-58.
Fladischer K, Ernst W, Reingruber H, Holst B. Imaging with neutral atoms using a single crystal silicon wafer. In 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society. . 2008. p. 58-58
Fladischer, Katrin ; Ernst, Wolfgang ; Reingruber, Herbert ; Holst, Bodil. / Imaging with neutral atoms using a single crystal silicon wafer. 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society. ., 2008. pp. 58-58
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