Imaging atom probe study of material transfer and plastic deformation of STM tips after contact

Alexander Fian, Manfred Leisch

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationBook of abstracts - JVC 8
Place of PublicationZagreb
Publisher.
Pages55-56
Publication statusPublished - 2000
EventJoint Vacuum Conference - Pula, Croatia
Duration: 4 Jun 20009 Jun 2000

Conference

ConferenceJoint Vacuum Conference
CountryCroatia
CityPula
Period4/06/009/06/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Imaging atom probe study of material transfer and plastic deformation of STM tips after contact. / Fian, Alexander; Leisch, Manfred.

Book of abstracts - JVC 8. Zagreb : ., 2000. p. 55-56.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Fian, A & Leisch, M 2000, Imaging atom probe study of material transfer and plastic deformation of STM tips after contact. in Book of abstracts - JVC 8. ., Zagreb, pp. 55-56, Joint Vacuum Conference, Pula, Croatia, 4/06/00.
@inproceedings{34efba12d2384de2bb94fd4ff8f7aeba,
title = "Imaging atom probe study of material transfer and plastic deformation of STM tips after contact",
author = "Alexander Fian and Manfred Leisch",
note = "ISBN 953-98154-0-X",
year = "2000",
language = "English",
pages = "55--56",
booktitle = "Book of abstracts - JVC 8",
publisher = ".",

}

TY - GEN

T1 - Imaging atom probe study of material transfer and plastic deformation of STM tips after contact

AU - Fian, Alexander

AU - Leisch, Manfred

N1 - ISBN 953-98154-0-X

PY - 2000

Y1 - 2000

M3 - Conference contribution

SP - 55

EP - 56

BT - Book of abstracts - JVC 8

PB - .

CY - Zagreb

ER -