Imaging atom probe characterization of STM tips

Alexander Fian, Manfred Leisch

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEurophysics conference abstracts ; 24 C
Place of PublicationParis
PublisherEuropean Physical Society
Pages155-155
Publication statusPublished - 2000
EventEuropean Conference on Surface Science - Madrid, Spain
Duration: 5 Sep 20008 Sep 2000

Conference

ConferenceEuropean Conference on Surface Science
CountrySpain
CityMadrid
Period5/09/008/09/00

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

Fian, A., & Leisch, M. (2000). Imaging atom probe characterization of STM tips. In Europhysics conference abstracts ; 24 C (pp. 155-155). Paris: European Physical Society.

Imaging atom probe characterization of STM tips. / Fian, Alexander; Leisch, Manfred.

Europhysics conference abstracts ; 24 C. Paris : European Physical Society, 2000. p. 155-155.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Fian, A & Leisch, M 2000, Imaging atom probe characterization of STM tips. in Europhysics conference abstracts ; 24 C. European Physical Society, Paris, pp. 155-155, European Conference on Surface Science, Madrid, Spain, 5/09/00.
Fian A, Leisch M. Imaging atom probe characterization of STM tips. In Europhysics conference abstracts ; 24 C. Paris: European Physical Society. 2000. p. 155-155
Fian, Alexander ; Leisch, Manfred. / Imaging atom probe characterization of STM tips. Europhysics conference abstracts ; 24 C. Paris : European Physical Society, 2000. pp. 155-155
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