Imaging atom probe characterization of STM tips

Alexander Fian, Manfred Leisch

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEurophysics conference abstracts ; 24 C
Place of PublicationParis
PublisherEuropean Physical Society
Pages155-155
Publication statusPublished - 2000
EventEuropean Conference on Surface Science - Madrid, Spain
Duration: 5 Sep 20008 Sep 2000

Conference

ConferenceEuropean Conference on Surface Science
CountrySpain
CityMadrid
Period5/09/008/09/00

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

Fian, A., & Leisch, M. (2000). Imaging atom probe characterization of STM tips. In Europhysics conference abstracts ; 24 C (pp. 155-155). Paris: European Physical Society.