IEC 61000-4-2 ESD test in display down configurationfor cell phones

Jianchi Zhou, Satyajeet Shinde, Yuandong Guo, Atieh Talebzadeh, Shubhankar Marathe, Yingjie Gan, Ki Hyuk Kim, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

During the IEC 61000-4-2 test the DUT is placed on a 0.5 mm insulating sheet, which is on the horizontal coupling plane (HCP). For discharge points on the back side of the phone this leads to a situation in which the display is facing the HCP. The phone or tablet forms a capacitance between 50 pF and 300 pF to the HCP. The capacitance value depends on the size of the phone, its screen flatness, and the flatness of the insulator which may deteriorate over time. The discharges to the phone lead to a large displacement current flowing through the display. This current has multiple paths to the body of the phone: via the touch electronics, via the display electronics, and directly to the body of the phone. As these currents can reach 30 A (at 8 kV contact mode) they can lead to upset and damage of both the display and the touch layers. This paper provides analysis of the display down test situation in order to show reproducibility problems. The effect of the capacitance variation is shown by the measurement and the PSPICE model. Full-wave model was used to help understand how much of the total current flows through the body of the phone. The Lichtenberg dust figure method was used to show the contribution of the corona discharge.

Original languageEnglish
Title of host publication2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016
PublisherInstitute of Electrical and Electronics Engineers
Pages713-718
Number of pages6
ISBN (Electronic)9781509014415
DOIs
Publication statusPublished - 19 Sep 2016
Externally publishedYes
Event2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016 - Ottawa, Canada
Duration: 25 Jul 201629 Jul 2016

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2016-September
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016
CountryCanada
CityOttawa
Period25/07/1629/07/16

Keywords

  • display
  • Electrostatic discharge
  • IEC 61000-4-2
  • mobile phone

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Zhou, J., Shinde, S., Guo, Y., Talebzadeh, A., Marathe, S., Gan, Y., ... Pommerenke, D. (2016). IEC 61000-4-2 ESD test in display down configurationfor cell phones. In 2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016 (pp. 713-718). [7571736] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2016-September). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2016.7571736