Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics

Matthias Flatscher*, Markus Neumayer, Thomas Bretterklieber

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.
Translated title of the contributionHolistic analysis for electrical capacitance tomography front-end electronics
Original languageEnglish
Article number092008
Number of pages4
JournalJournal of Physics: Conference Series
Volume1065
DOIs
Publication statusPublished - 2018
EventXXII World Congress of the International Measurement Confederation - Belfast Waterfront, Belfast, United Kingdom
Duration: 3 Sep 20186 Sep 2018
Conference number: 22
http://www.imeko2018.org/

Fingerprint

Dive into the research topics of 'Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics'. Together they form a unique fingerprint.

Cite this