Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.
Original languageEnglish
Title of host publicationXXII World Congress of the International Measurement Confederation (IMEKO 2018)
PublisherInstitute of Physics Publ.
Number of pages4
Volume1065
DOIs
Publication statusPublished - Sep 2018
EventXXII World Congress of the International Measurement Confederation - Belfast Waterfront, Belfast, United Kingdom
Duration: 3 Sep 20186 Sep 2018
Conference number: 22
http://www.imeko2018.org/

Conference

ConferenceXXII World Congress of the International Measurement Confederation
Abbreviated titleIMEKO
CountryUnited Kingdom
CityBelfast
Period3/09/186/09/18
Internet address

Fingerprint

Tomography
Capacitance
Electronic equipment
Networks (circuits)
Sensors

Cite this

Flatscher, M., Neumayer, M., & Bretterklieber, T. (2018). Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. In XXII World Congress of the International Measurement Confederation (IMEKO 2018) (Vol. 1065). Institute of Physics Publ.. https://doi.org/10.1088/1742-6596/1065/9/092008

Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. / Flatscher, Matthias; Neumayer, Markus; Bretterklieber, Thomas.

XXII World Congress of the International Measurement Confederation (IMEKO 2018). Vol. 1065 Institute of Physics Publ., 2018.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Flatscher, M, Neumayer, M & Bretterklieber, T 2018, Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. in XXII World Congress of the International Measurement Confederation (IMEKO 2018). vol. 1065, Institute of Physics Publ., XXII World Congress of the International Measurement Confederation, Belfast, United Kingdom, 3/09/18. https://doi.org/10.1088/1742-6596/1065/9/092008
Flatscher M, Neumayer M, Bretterklieber T. Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. In XXII World Congress of the International Measurement Confederation (IMEKO 2018). Vol. 1065. Institute of Physics Publ. 2018 https://doi.org/10.1088/1742-6596/1065/9/092008
Flatscher, Matthias ; Neumayer, Markus ; Bretterklieber, Thomas. / Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. XXII World Congress of the International Measurement Confederation (IMEKO 2018). Vol. 1065 Institute of Physics Publ., 2018.
@inproceedings{5d613be544e44ba0b29acd7d8e23f4c8,
title = "Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics",
abstract = "The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.",
author = "Matthias Flatscher and Markus Neumayer and Thomas Bretterklieber",
year = "2018",
month = "9",
doi = "10.1088/1742-6596/1065/9/092008",
language = "English",
volume = "1065",
booktitle = "XXII World Congress of the International Measurement Confederation (IMEKO 2018)",
publisher = "Institute of Physics Publ.",

}

TY - GEN

T1 - Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics

AU - Flatscher, Matthias

AU - Neumayer, Markus

AU - Bretterklieber, Thomas

PY - 2018/9

Y1 - 2018/9

N2 - The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.

AB - The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.

U2 - 10.1088/1742-6596/1065/9/092008

DO - 10.1088/1742-6596/1065/9/092008

M3 - Conference contribution

VL - 1065

BT - XXII World Congress of the International Measurement Confederation (IMEKO 2018)

PB - Institute of Physics Publ.

ER -