Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.
    Original languageEnglish
    Title of host publicationXXII World Congress of the International Measurement Confederation (IMEKO 2018)
    PublisherInstitute of Physics Publ.
    Number of pages4
    Volume1065
    DOIs
    Publication statusPublished - Sep 2018
    EventXXII World Congress of the International Measurement Confederation - Belfast Waterfront, Belfast, United Kingdom
    Duration: 3 Sep 20186 Sep 2018
    Conference number: 22
    http://www.imeko2018.org/

    Conference

    ConferenceXXII World Congress of the International Measurement Confederation
    Abbreviated titleIMEKO
    CountryUnited Kingdom
    CityBelfast
    Period3/09/186/09/18
    Internet address

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