Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics

Research output: Chapter in Book/Report/Conference proceedingConference paper

Abstract

The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.
Original languageEnglish
Title of host publicationXXII World Congress of the International Measurement Confederation (IMEKO 2018)
PublisherInstitute of Physics Publ.
Number of pages4
Volume1065
DOIs
Publication statusPublished - Sep 2018
EventXXII World Congress of the International Measurement Confederation - Belfast Waterfront, Belfast, United Kingdom
Duration: 3 Sep 20186 Sep 2018
Conference number: 22
http://www.imeko2018.org/

Conference

ConferenceXXII World Congress of the International Measurement Confederation
Abbreviated titleIMEKO
CountryUnited Kingdom
CityBelfast
Period3/09/186/09/18
Internet address

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