Original language | English |
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Title of host publication | ESREF2019_Proceedings |
Chapter | session C 2.1 |
Number of pages | 6 |
Publication status | Published - 2019 |
Event | 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Centre de congres P. Baudis, Toulouse , France Duration: 23 Sept 2019 → 26 Sept 2019 https://imina.ch/events/conference-semiconductor-Failure-Analysis-ESREF-2019-Toulouse-France |
Conference
Conference | 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis |
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Abbreviated title | ESREF 2019 |
Country/Territory | France |
City | Toulouse |
Period | 23/09/19 → 26/09/19 |
Internet address |
ASJC Scopus subject areas
- General Materials Science
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)