High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM

Harald Matthias Fitzek; Hartmuth Schröttner; Julian Wagner; Ferdinand Hofer; Johannes Rattenberger

doi:10.1111/jmi.12347

High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM

Harald Matthias Fitzek, Hartmuth Schröttner, Julian Wagner, Ferdinand Hofer, Johannes Rattenberger

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	85-91
Journal	Journal of Microscopy
Volume	262
DOIs	https://doi.org/10.1111/jmi.12347
Publication status	Published - Jan 2016

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Advanced Materials Science

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10.1111/jmi.12347

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High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM. / Fitzek, Harald Matthias ; Schröttner, Hartmuth; Wagner, Julian et al.
In: Journal of Microscopy, Vol. 262, 01.2016, p. 85-91.

Research output: Contribution to journal › Article › peer-review

@article{264722bea5764a058b4fb8396618474e,

title = "High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM",

author = "Fitzek, {Harald Matthias} and Hartmuth Schr{\"o}ttner and Julian Wagner and Ferdinand Hofer and Johannes Rattenberger",

year = "2016",

month = jan,

doi = "10.1111/jmi.12347",

language = "English",

volume = "262",

pages = "85--91",

journal = "Journal of Microscopy",

issn = "1365-2818",

publisher = "Wiley-Blackwell",

}

TY - JOUR

T1 - High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM

AU - Fitzek, Harald Matthias

AU - Schröttner, Hartmuth

AU - Wagner, Julian

AU - Hofer, Ferdinand

AU - Rattenberger, Johannes

PY - 2016/1

Y1 - 2016/1

U2 - 10.1111/jmi.12347

DO - 10.1111/jmi.12347

M3 - Article

SN - 1365-2818

VL - 262

SP - 85

EP - 91

JO - Journal of Microscopy

JF - Journal of Microscopy

ER -