High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 3 May 2015
EventEuropean Workshop on Modern Developments and Applications in Microbeam Analysis - Portoroz, Slovenia
Duration: 3 May 20157 May 2015

Conference

ConferenceEuropean Workshop on Modern Developments and Applications in Microbeam Analysis
CountrySlovenia
CityPortoroz
Period3/05/157/05/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

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Cite this

Mitsche, S., Melischnig, A., Haberfehlner, G., Dienstleder, M., & Pölt, P. (2015). High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slovenia.