High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationModern development and applications in microbeam analysis
Publisher.
Pages373-373
Publication statusPublished - 2015
EventEuropean Workshop on Modern Developments and Applications in Microbeam Analysis - Portoroz, Slovenia
Duration: 3 May 20157 May 2015

Conference

ConferenceEuropean Workshop on Modern Developments and Applications in Microbeam Analysis
CountrySlovenia
CityPortoroz
Period3/05/157/05/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • My Favorites
  • Basic - Fundamental (Grundlagenforschung)

Cite this

High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. / Mitsche, Stefan; Haberfehlner, Georg; Dienstleder, Martina; Pölt, Peter.

Modern development and applications in microbeam analysis. ., 2015. p. 373-373.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Mitsche, S, Haberfehlner, G, Dienstleder, M & Pölt, P 2015, High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. in Modern development and applications in microbeam analysis. ., pp. 373-373, European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slovenia, 3/05/15.
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AU - Mitsche, Stefan

AU - Haberfehlner, Georg

AU - Dienstleder, Martina

AU - Pölt, Peter

PY - 2015

Y1 - 2015

M3 - Conference contribution

SP - 373

EP - 373

BT - Modern development and applications in microbeam analysis

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