High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2015
EventEuropean Workshop on Modern Developments and Applications in Microbeam Analysis - Portoroz, Slovenia
Duration: 3 May 20157 May 2015

Conference

ConferenceEuropean Workshop on Modern Developments and Applications in Microbeam Analysis
CountrySlovenia
CityPortoroz
Period3/05/157/05/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Mitsche, S., Haberfehlner, G., Dienstleder, M., & Pölt, P. (2015). High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. Poster session presented at European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slovenia.

High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. / Mitsche, Stefan; Haberfehlner, Georg; Dienstleder, Martina; Pölt, Peter.

2015. Poster session presented at European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slovenia.

Research output: Contribution to conferencePosterResearch

Mitsche, S, Haberfehlner, G, Dienstleder, M & Pölt, P 2015, 'High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy' European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slovenia, 3/05/15 - 7/05/15, .
Mitsche S, Haberfehlner G, Dienstleder M, Pölt P. High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. 2015. Poster session presented at European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slovenia.
Mitsche, Stefan ; Haberfehlner, Georg ; Dienstleder, Martina ; Pölt, Peter. / High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. Poster session presented at European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slovenia.
@conference{9cd6ac6e4c874ae58edc34e847624c7b,
title = "High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy",
author = "Stefan Mitsche and Georg Haberfehlner and Martina Dienstleder and Peter P{\"o}lt",
year = "2015",
language = "English",
note = "European Workshop on Modern Developments and Applications in Microbeam Analysis ; Conference date: 03-05-2015 Through 07-05-2015",

}

TY - CONF

T1 - High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

AU - Mitsche, Stefan

AU - Haberfehlner, Georg

AU - Dienstleder, Martina

AU - Pölt, Peter

PY - 2015

Y1 - 2015

M3 - Poster

ER -