High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope

Gerald Kothleitner, Michael Rogers, Bernd Kolbesen, Werner Grogger

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication13th European Microscopy Congress
Publisher.
Pages441-442
Publication statusPublished - 2004

Cite this

Kothleitner, G., Rogers, M., Kolbesen, B., & Grogger, W. (2004). High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. In 13th European Microscopy Congress (pp. 441-442). ..

High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. / Kothleitner, Gerald; Rogers, Michael; Kolbesen, Bernd; Grogger, Werner.

13th European Microscopy Congress. ., 2004. p. 441-442.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Kothleitner, G, Rogers, M, Kolbesen, B & Grogger, W 2004, High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. in 13th European Microscopy Congress. ., pp. 441-442.
Kothleitner G, Rogers M, Kolbesen B, Grogger W. High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. In 13th European Microscopy Congress. . 2004. p. 441-442
Kothleitner, Gerald ; Rogers, Michael ; Kolbesen, Bernd ; Grogger, Werner. / High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. 13th European Microscopy Congress. ., 2004. pp. 441-442
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