High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2004
Event13th European Microscopy Congress - Antwerpen / Belgien
Duration: 22 Aug 200427 Aug 2004

Conference

Conference13th European Microscopy Congress
CityAntwerpen / Belgien
Period22/08/0427/08/04

Cite this

Kothleitner, G. (2004). High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .

High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. / Kothleitner, Gerald.

2004. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .

Research output: Contribution to conferencePosterResearch

Kothleitner, G 2004, 'High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope' 13th European Microscopy Congress, Antwerpen / Belgien, 22/08/04 - 27/08/04, .
Kothleitner G. High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. 2004. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .
Kothleitner, Gerald. / High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .
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author = "Gerald Kothleitner",
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note = "13th European Microscopy Congress ; Conference date: 22-08-2004 Through 27-08-2004",

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TY - CONF

T1 - High resolution STEM EELS and EFTEM investigations on FIB samples with a monochromator microscope

AU - Kothleitner, Gerald

PY - 2004

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