High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys

Mihaela Albu, J. Li, P. Schumacher, Ferdinand Hofer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInstrumentation and Methods; Materials Science
Publisher.
Pages672-673
Publication statusPublished - 2013
EventMicroscopy Conference - Regensburg, Germany
Duration: 25 Aug 201330 Aug 2013

Conference

ConferenceMicroscopy Conference
Abbreviated titleMC
CountryGermany
CityRegensburg
Period25/08/1330/08/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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