High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys

Mihaela Albu, J. Li, P. Schumacher, Ferdinand Hofer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInstrumentation and Methods; Materials Science
Publisher.
Pages672-673
Publication statusPublished - 2013
EventMicroscopy Conference - Regensburg, Germany
Duration: 25 Aug 201330 Aug 2013

Conference

ConferenceMicroscopy Conference
Abbreviated titleMC
CountryGermany
CityRegensburg
Period25/08/1330/08/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Albu, M., Li, J., Schumacher, P., & Hofer, F. (2013). High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys. In Instrumentation and Methods; Materials Science (pp. 672-673). ..

High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys. / Albu, Mihaela; Li, J.; Schumacher, P.; Hofer, Ferdinand.

Instrumentation and Methods; Materials Science. ., 2013. p. 672-673.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Albu, M, Li, J, Schumacher, P & Hofer, F 2013, High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys. in Instrumentation and Methods; Materials Science. ., pp. 672-673, Microscopy Conference, Regensburg, Germany, 25/08/13.
Albu M, Li J, Schumacher P, Hofer F. High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys. In Instrumentation and Methods; Materials Science. . 2013. p. 672-673
Albu, Mihaela ; Li, J. ; Schumacher, P. ; Hofer, Ferdinand. / High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys. Instrumentation and Methods; Materials Science. ., 2013. pp. 672-673
@inproceedings{112ca4eac8fd4860a5a21e31c1d88123,
title = "High resolution STEM analysis of Sr and Yb in Al - 5wt.{\%} Si alloys",
author = "Mihaela Albu and J. Li and P. Schumacher and Ferdinand Hofer",
year = "2013",
language = "English",
pages = "672--673",
booktitle = "Instrumentation and Methods; Materials Science",
publisher = ".",

}

TY - GEN

T1 - High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys

AU - Albu, Mihaela

AU - Li, J.

AU - Schumacher, P.

AU - Hofer, Ferdinand

PY - 2013

Y1 - 2013

UR - http://www.mc2013.de

M3 - Conference contribution

SP - 672

EP - 673

BT - Instrumentation and Methods; Materials Science

PB - .

ER -