High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys

Mihaela Albu, J. Li, P. Schumacher, Ferdinand Hofer

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Instrumentation and Methods; Materials Science
Publisher	.
Pages	672-673
Publication status	Published - 2013
Event	Microscopy Conference 2013: MC13 - Regensburg, Germany Duration: 25 Aug 2013 → 30 Aug 2013

Fields of Expertise

@inproceedings{112ca4eac8fd4860a5a21e31c1d88123,

title = "High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys",

author = "Mihaela Albu and J. Li and P. Schumacher and Ferdinand Hofer",

year = "2013",

language = "English",

pages = "672--673",

booktitle = "Instrumentation and Methods; Materials Science",

publisher = ".",

note = "Microscopy Conference 2013 : MC13, MC ; Conference date: 25-08-2013 Through 30-08-2013",

}

TY - GEN

T1 - High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys

AU - Albu, Mihaela

AU - Li, J.

AU - Schumacher, P.

AU - Hofer, Ferdinand

PY - 2013

Y1 - 2013

UR - http://www.mc2013.de

M3 - Conference paper

SP - 672

EP - 673

BT - Instrumentation and Methods; Materials Science

PB - .

T2 - Microscopy Conference 2013

Y2 - 25 August 2013 through 30 August 2013

ER -