High Resolution EELS using monochromator and high performance spectrometer: comparison of V2O5 ELNES with NEXAFS and band structure calculations

Gerald Kothleitner, Dengshang Su, Henny W. Zandbergen, Peter Tiemeijer, M. Hävecker, Cecile Hebert, A. Knop-Gericke, Bert Freitag, Ferdinand Hofer, Robert Schlögl

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)235-238
JournalMicron
Issue number34
Publication statusPublished - 2003

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Projects

Near-Edge Fine Structures in EELS

Kothleitner, G., Grogger, W., Hofer, F., Wewerka, K., Letofsky-Papst, I. & Mitterbauer, C.

1/02/0031/12/05

Project: Research area

Analytical Electron Microscopy

Schaffer, B., Hofer, F., Rogers, M., Mitterbauer, C. & Wewerka, K.

1/01/9531/01/03

Project: Research area

Cite this

Kothleitner, G., Su, D., Zandbergen, H. W., Tiemeijer, P., Hävecker, M., Hebert, C., ... Schlögl, R. (2003). High Resolution EELS using monochromator and high performance spectrometer: comparison of V2O5 ELNES with NEXAFS and band structure calculations. Micron, (34), 235-238.