High-resolution EELS measurements for the mapping of direct bandgap

Gerald Kothleitner, Bernhard Schaffer

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to conference › (Old data) Lecture or Presentation

Original language	English
Publication status	Published - 6 Oct 2009
Event	ECS Meeting - Wien, Austria Duration: 4 Oct 2009 → 9 Oct 2009

Conference

Conference	ECS Meeting
Country/Territory	Austria
City	Wien
Period	4/10/09 → 9/10/09

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Nanoanalysis using transmission electron microscopy
1/01/04 → …
Project: Research area

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