High Quality Photogrammetric Scanning for Mapping

M. Gruber, Franz Leberl

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationChina International Geoinformatics Industry, Technology and Equipment Exhibition
Number of pages15
Publication statusPublished - 2000

Cite this

Gruber, M., & Leberl, F. (2000). High Quality Photogrammetric Scanning for Mapping. In China International Geoinformatics Industry, Technology and Equipment Exhibition

High Quality Photogrammetric Scanning for Mapping. / Gruber, M.; Leberl, Franz.

China International Geoinformatics Industry, Technology and Equipment Exhibition. 2000.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Gruber, M & Leberl, F 2000, High Quality Photogrammetric Scanning for Mapping. in China International Geoinformatics Industry, Technology and Equipment Exhibition.
Gruber M, Leberl F. High Quality Photogrammetric Scanning for Mapping. In China International Geoinformatics Industry, Technology and Equipment Exhibition. 2000
Gruber, M. ; Leberl, Franz. / High Quality Photogrammetric Scanning for Mapping. China International Geoinformatics Industry, Technology and Equipment Exhibition. 2000.
@inproceedings{7700d6ee7c3d4bfdacf91bb675b961e0,
title = "High Quality Photogrammetric Scanning for Mapping",
author = "M. Gruber and Franz Leberl",
year = "2000",
language = "English",
booktitle = "China International Geoinformatics Industry, Technology and Equipment Exhibition",

}

TY - GEN

T1 - High Quality Photogrammetric Scanning for Mapping

AU - Gruber, M.

AU - Leberl, Franz

PY - 2000

Y1 - 2000

M3 - Conference contribution

BT - China International Geoinformatics Industry, Technology and Equipment Exhibition

ER -