High precision measurement of the SOS surface thickness in the rough phase

HG EVERTZ; Martin Hasenbusch; Mihai Marcu; Klaus Pinn; Sorin Solomon

doi:10.1051/jp1:1991234

High precision measurement of the SOS surface thickness in the rough phase

HG EVERTZ, Martin Hasenbusch, Mihai Marcu, Klaus Pinn, Sorin Solomon

Institute of Theoretical and Computational Physics (5150)

Research output: Contribution to journal › Article › peer-review

Abstract

Using a cluster algorithm without critical slowing down for the discrete Gaussian SOS model, we verify to high precision the linear dependence of the surface thickness on the logarithm of the lattice size.

Original language	English
Pages (from-to)	1669 - 1673
Journal	Journal De Physique, I
Volume	1
Issue number	12
DOIs	https://doi.org/10.1051/jp1:1991234
Publication status	Published - 1991

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title = "High precision measurement of the SOS surface thickness in the rough phase",

abstract = "Using a cluster algorithm without critical slowing down for the discrete Gaussian SOS model, we verify to high precision the linear dependence of the surface thickness on the logarithm of the lattice size.",

author = "HG EVERTZ and Martin Hasenbusch and Mihai Marcu and Klaus Pinn and Sorin Solomon",

year = "1991",

doi = "10.1051/jp1:1991234",

language = "English",

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journal = "Journal De Physique, I",

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AU - EVERTZ, HG

AU - Hasenbusch, Martin

AU - Marcu, Mihai

AU - Pinn, Klaus

AU - Solomon, Sorin

PY - 1991

Y1 - 1991

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AB - Using a cluster algorithm without critical slowing down for the discrete Gaussian SOS model, we verify to high precision the linear dependence of the surface thickness on the logarithm of the lattice size.

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U2 - 10.1051/jp1:1991234

DO - 10.1051/jp1:1991234

M3 - Article

SN - 1286-4862

VL - 1

SP - 1669

EP - 1673

JO - Journal De Physique, I

JF - Journal De Physique, I

IS - 12

ER -

High precision measurement of the SOS surface thickness in the rough phase

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