High level fault injection for attack simulation in smart cards

Klaus Rothbart, Ulrich Neffe, Christian Steger, Reinhold Weiß, Edgar Rieger, Andreas Mühlberger

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings / 13th Asian Test Symposium
Place of PublicationLos Alamitos, Calif.
Publisher.
Pages118-121
ISBN (Print)0-7695-2235-1
Publication statusPublished - 2004
EventAsian Test Symposium - Kenting, Taiwan, Province of China
Duration: 15 Nov 200417 Nov 2004

Conference

ConferenceAsian Test Symposium
CountryTaiwan, Province of China
CityKenting
Period15/11/0417/11/04

Cite this

Rothbart, K., Neffe, U., Steger, C., Weiß, R., Rieger, E., & Mühlberger, A. (2004). High level fault injection for attack simulation in smart cards. In Proceedings / 13th Asian Test Symposium (pp. 118-121). Los Alamitos, Calif.: ..