High-Fidelity Shapes and Disruption Mechanism during Focused Electron Beam Induced Deposition

Robert Winkler, Georg Arnold, Roland Schmied, Aleksandra Szkudlarek, Angelina Orthacker, Jason D. Fowlkes, R. Timilsina, Gerald Kothleitner, Philip D. Rack, Ivo Utke, Harald Plank

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationASEM Workshop Advanced Electron Microscopy
Publisher.
Pages36-36
Publication statusPublished - 2015
Event5th ASEM Workshop - Graz, Austria
Duration: 7 Jun 20158 Jun 2015

Conference

Conference5th ASEM Workshop
CountryAustria
CityGraz
Period7/06/158/06/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

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Cite this

Winkler, R., Arnold, G., Schmied, R., Szkudlarek, A., Orthacker, A., Fowlkes, J. D., ... Plank, H. (2015). High-Fidelity Shapes and Disruption Mechanism during Focused Electron Beam Induced Deposition. In ASEM Workshop Advanced Electron Microscopy (pp. 36-36). ..

High-Fidelity Shapes and Disruption Mechanism during Focused Electron Beam Induced Deposition. / Winkler, Robert; Arnold, Georg; Schmied, Roland; Szkudlarek, Aleksandra; Orthacker, Angelina; Fowlkes, Jason D.; Timilsina, R.; Kothleitner, Gerald; Rack, Philip D.; Utke, Ivo; Plank, Harald.

ASEM Workshop Advanced Electron Microscopy. ., 2015. p. 36-36.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Winkler, R, Arnold, G, Schmied, R, Szkudlarek, A, Orthacker, A, Fowlkes, JD, Timilsina, R, Kothleitner, G, Rack, PD, Utke, I & Plank, H 2015, High-Fidelity Shapes and Disruption Mechanism during Focused Electron Beam Induced Deposition. in ASEM Workshop Advanced Electron Microscopy. ., pp. 36-36, 5th ASEM Workshop, Graz, Austria, 7/06/15.
Winkler R, Arnold G, Schmied R, Szkudlarek A, Orthacker A, Fowlkes JD et al. High-Fidelity Shapes and Disruption Mechanism during Focused Electron Beam Induced Deposition. In ASEM Workshop Advanced Electron Microscopy. . 2015. p. 36-36
Winkler, Robert ; Arnold, Georg ; Schmied, Roland ; Szkudlarek, Aleksandra ; Orthacker, Angelina ; Fowlkes, Jason D. ; Timilsina, R. ; Kothleitner, Gerald ; Rack, Philip D. ; Utke, Ivo ; Plank, Harald. / High-Fidelity Shapes and Disruption Mechanism during Focused Electron Beam Induced Deposition. ASEM Workshop Advanced Electron Microscopy. ., 2015. pp. 36-36
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AU - Fowlkes, Jason D.

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