High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides

Christoph Mitterbauer, Gerald Kothleitner, Ferdinand Hofer, Peter Tiemeijer, Bert Freitag, Henny W. Zandenbergen

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)86-87
JournalMicroscopy and microanalysis
Volume9
Issue numberSuppl. 3
Publication statusPublished - 2003

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides. / Mitterbauer, Christoph; Kothleitner, Gerald; Hofer, Ferdinand; Tiemeijer, Peter; Freitag, Bert; Zandenbergen, Henny W.

In: Microscopy and microanalysis, Vol. 9, No. Suppl. 3, 2003, p. 86-87.

Research output: Contribution to journalArticleResearchpeer-review

Mitterbauer, Christoph ; Kothleitner, Gerald ; Hofer, Ferdinand ; Tiemeijer, Peter ; Freitag, Bert ; Zandenbergen, Henny W. / High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides. In: Microscopy and microanalysis. 2003 ; Vol. 9, No. Suppl. 3. pp. 86-87.
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AU - Tiemeijer, Peter

AU - Freitag, Bert

AU - Zandenbergen, Henny W.

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