Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection

Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiß, Holger Bock, Josef Haid

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

LanguageEnglish
Title of host publication21th IEEE Asian Test Symposium (ATS)
Publisher.
Pages149-154
StatusPublished - 2012
Event21th IEEE Asian Test Symposium - Niigata, Japan
Duration: 19 Nov 201222 Nov 2012

Conference

Conference21th IEEE Asian Test Symposium
CountryJapan
CityNiigata
Period19/11/1222/11/12

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

Cite this

Krieg, A., Grinschgl, J., Steger, C., Weiß, R., Bock, H., & Haid, J. (2012). Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection. In 21th IEEE Asian Test Symposium (ATS) (pp. 149-154). ..

Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection. / Krieg, Armin; Grinschgl, Johannes; Steger, Christian; Weiß, Reinhold; Bock, Holger; Haid, Josef.

21th IEEE Asian Test Symposium (ATS). ., 2012. p. 149-154.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Krieg, A, Grinschgl, J, Steger, C, Weiß, R, Bock, H & Haid, J 2012, Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection. in 21th IEEE Asian Test Symposium (ATS). ., pp. 149-154, 21th IEEE Asian Test Symposium, Niigata, Japan, 19/11/12.
Krieg A, Grinschgl J, Steger C, Weiß R, Bock H, Haid J. Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection. In 21th IEEE Asian Test Symposium (ATS). .2012. p. 149-154.
Krieg, Armin ; Grinschgl, Johannes ; Steger, Christian ; Weiß, Reinhold ; Bock, Holger ; Haid, Josef. / Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection. 21th IEEE Asian Test Symposium (ATS). ., 2012. pp. 149-154
@inproceedings{968f4b1b29f641698511332837c31b53,
title = "Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection",
author = "Armin Krieg and Johannes Grinschgl and Christian Steger and Reinhold Wei{\ss} and Holger Bock and Josef Haid",
year = "2012",
language = "English",
pages = "149--154",
booktitle = "21th IEEE Asian Test Symposium (ATS)",
publisher = ".",

}

TY - GEN

T1 - Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection

AU - Krieg,Armin

AU - Grinschgl,Johannes

AU - Steger,Christian

AU - Weiß,Reinhold

AU - Bock,Holger

AU - Haid,Josef

PY - 2012

Y1 - 2012

M3 - Conference contribution

SP - 149

EP - 154

BT - 21th IEEE Asian Test Symposium (ATS)

PB - .

ER -