Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

Markus Neuschitzer, Armin Moser, Alfred Neuhold, Johanna Kraxner, Barbara Stadlober, Martin Oehzelt, Ingo Salzmann, Roland Resel, Jiri Novak

Research output: Contribution to journalArticleResearchpeer-review

Original languageGerman
Pages (from-to)1-4
JournalJournal of applied crystallography
Volume45
DOIs
Publication statusPublished - 2012

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Cite this

Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment. / Neuschitzer, Markus; Moser, Armin; Neuhold, Alfred; Kraxner, Johanna; Stadlober, Barbara; Oehzelt, Martin; Salzmann, Ingo; Resel, Roland; Novak, Jiri.

In: Journal of applied crystallography, Vol. 45, 2012, p. 1-4.

Research output: Contribution to journalArticleResearchpeer-review

Neuschitzer, Markus ; Moser, Armin ; Neuhold, Alfred ; Kraxner, Johanna ; Stadlober, Barbara ; Oehzelt, Martin ; Salzmann, Ingo ; Resel, Roland ; Novak, Jiri. / Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment. In: Journal of applied crystallography. 2012 ; Vol. 45. pp. 1-4.
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AU - Neuschitzer, Markus

AU - Moser, Armin

AU - Neuhold, Alfred

AU - Kraxner, Johanna

AU - Stadlober, Barbara

AU - Oehzelt, Martin

AU - Salzmann, Ingo

AU - Resel, Roland

AU - Novak, Jiri

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JO - Journal of applied crystallography

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SN - 0021-8898

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