Global small-angle X-ray scattering data analysis for multilamellar vesicles: the evolution of the scattering density profile model

Peter Heftberger, Benjamin Kollmitzer, Frederick A Heberle, Jianjun Pan, Michael Paul Rappolt, Heinz Amenitsch, Norbert Kucerka, John Katsaras, Georg Pabst

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)173-178
JournalJournal of applied crystallography
Volume47
Issue number1
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Global small-angle X-ray scattering data analysis for multilamellar vesicles: the evolution of the scattering density profile model. / Heftberger, Peter; Kollmitzer, Benjamin; Heberle, Frederick A; Pan, Jianjun; Rappolt, Michael Paul; Amenitsch, Heinz; Kucerka, Norbert; Katsaras, John; Pabst, Georg.

In: Journal of applied crystallography, Vol. 47, No. 1, 2014, p. 173-178.

Research output: Contribution to journalArticleResearchpeer-review

Heftberger, P, Kollmitzer, B, Heberle, FA, Pan, J, Rappolt, MP, Amenitsch, H, Kucerka, N, Katsaras, J & Pabst, G 2014, 'Global small-angle X-ray scattering data analysis for multilamellar vesicles: the evolution of the scattering density profile model' Journal of applied crystallography, vol. 47, no. 1, pp. 173-178.
Heftberger, Peter ; Kollmitzer, Benjamin ; Heberle, Frederick A ; Pan, Jianjun ; Rappolt, Michael Paul ; Amenitsch, Heinz ; Kucerka, Norbert ; Katsaras, John ; Pabst, Georg. / Global small-angle X-ray scattering data analysis for multilamellar vesicles: the evolution of the scattering density profile model. In: Journal of applied crystallography. 2014 ; Vol. 47, No. 1. pp. 173-178.
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AU - Heftberger, Peter

AU - Kollmitzer, Benjamin

AU - Heberle, Frederick A

AU - Pan, Jianjun

AU - Rappolt, Michael Paul

AU - Amenitsch, Heinz

AU - Kucerka, Norbert

AU - Katsaras, John

AU - Pabst, Georg

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