Global small-angle X-ray scattering data analysis for multilamellar vesicles: the evolution of the scattering density profile model

Peter Heftberger, Benjamin Kollmitzer, Frederick A Heberle, Jianjun Pan, Michael Paul Rappolt, Heinz Amenitsch, Norbert Kucerka, John Katsaras, Georg Pabst

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)173-178
JournalJournal of Applied Crystallography
Issue number1
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this