GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations

Benedikt Schrode, Stefan Pachmajer, Michael Dohr, Christian Röthel, Jari Domke, Torsten Fritz, Roland Resel, Oliver Werzer

Research output: Contribution to journalArticleResearchpeer-review

Abstract

GIDVis is a software package based on MATLAB specialized for, but not limited to, the visualization and analysis of grazing-incidence thin-film X-ray diffraction data obtained during sample rotation around the surface normal. GIDVis allows the user to perform detector calibration, data stitching, intensity corrections, standard data evaluation (e.g. cuts and integrations along specific reciprocal-space directions), crystal phase analysis etc. To take full advantage of the measured data in the case of sample rotation, pole figures can easily be calculated from the experimental data for any value of the scattering angle covered. As an example, GIDVis is applied to phase analysis and the evaluation of the epitaxial alignment of pentacenequinone crystallites on a single-crystalline Au(111) surface.

Original languageEnglish
Pages (from-to)683-689
Number of pages7
JournalJournal of applied crystallography
Volume52
Issue number3
DOIs
Publication statusPublished - 1 Jun 2019

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Keywords

  • computer programs
  • epitaxy
  • GIDVis
  • grazing-incidence X-ray diffraction
  • pole figures
  • thin films

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

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