GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations

Benedikt Schrode; Stefan Pachmajer; Michael Dohr; Christian Röthel; Jari Domke; Torsten Fritz; Roland Resel; Oliver Werzer

doi:10.1107/S1600576719004485

GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations

Benedikt Schrode^*, Stefan Pachmajer, Michael Dohr, Christian Röthel, Jari Domke, Torsten Fritz, Roland Resel, Oliver Werzer

^*Corresponding author for this work

Institute of Solid State Physics (5130)

Research output: Contribution to journal › Article › peer-review

Abstract

GIDVis is a software package based on MATLAB specialized for, but not limited to, the visualization and analysis of grazing-incidence thin-film X-ray diffraction data obtained during sample rotation around the surface normal. GIDVis allows the user to perform detector calibration, data stitching, intensity corrections, standard data evaluation (e.g. cuts and integrations along specific reciprocal-space directions), crystal phase analysis etc. To take full advantage of the measured data in the case of sample rotation, pole figures can easily be calculated from the experimental data for any value of the scattering angle covered. As an example, GIDVis is applied to phase analysis and the evaluation of the epitaxial alignment of pentacenequinone crystallites on a single-crystalline Au(111) surface.

Original language	English
Pages (from-to)	683-689
Number of pages	7
Journal	Journal of Applied Crystallography
Volume	52
Issue number	3
DOIs	https://doi.org/10.1107/S1600576719004485
Publication status	Published - 1 Jun 2019

Keywords

computer programs
epitaxy
GIDVis
grazing-incidence X-ray diffraction
pole figures
thin films

ASJC Scopus subject areas

Biochemistry, Genetics and Molecular Biology(all)

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10.1107/S1600576719004485

Cite this

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title = "GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations",

abstract = "GIDVis is a software package based on MATLAB specialized for, but not limited to, the visualization and analysis of grazing-incidence thin-film X-ray diffraction data obtained during sample rotation around the surface normal. GIDVis allows the user to perform detector calibration, data stitching, intensity corrections, standard data evaluation (e.g. cuts and integrations along specific reciprocal-space directions), crystal phase analysis etc. To take full advantage of the measured data in the case of sample rotation, pole figures can easily be calculated from the experimental data for any value of the scattering angle covered. As an example, GIDVis is applied to phase analysis and the evaluation of the epitaxial alignment of pentacenequinone crystallites on a single-crystalline Au(111) surface.",

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year = "2019",

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doi = "10.1107/S1600576719004485",

language = "English",

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AU - Schrode, Benedikt

AU - Pachmajer, Stefan

AU - Dohr, Michael

AU - Röthel, Christian

AU - Domke, Jari

AU - Fritz, Torsten

AU - Resel, Roland

AU - Werzer, Oliver

PY - 2019/6/1

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AB - GIDVis is a software package based on MATLAB specialized for, but not limited to, the visualization and analysis of grazing-incidence thin-film X-ray diffraction data obtained during sample rotation around the surface normal. GIDVis allows the user to perform detector calibration, data stitching, intensity corrections, standard data evaluation (e.g. cuts and integrations along specific reciprocal-space directions), crystal phase analysis etc. To take full advantage of the measured data in the case of sample rotation, pole figures can easily be calculated from the experimental data for any value of the scattering angle covered. As an example, GIDVis is applied to phase analysis and the evaluation of the epitaxial alignment of pentacenequinone crystallites on a single-crystalline Au(111) surface.

KW - computer programs

KW - epitaxy

KW - GIDVis

KW - grazing-incidence X-ray diffraction

KW - pole figures

KW - thin films

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GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations

Abstract

Keywords

ASJC Scopus subject areas

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