Gas Sensing Characterisation of CMOS Integrated Nanocrystalline SnO2 – Au Thin Films

Robert Wimmer-Teubenbacher, Stephan Steinhauer, O. von Sicard, E. Magori, Jörg Siegert, Christian Gspan, Werner Grogger, Anton Köck

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMaterials Today : Proceedings; 2(8)
PublisherElsevier B.V.
Pages4295-4301
DOIs
Publication statusPublished - 2015
EventInternational Conference Functional Integrated Functional nano Systems - Graz, Austria
Duration: 3 Dec 20145 Dec 2014

Conference

ConferenceInternational Conference Functional Integrated Functional nano Systems
CountryAustria
CityGraz
Period3/12/145/12/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • My Favorites
  • Basic - Fundamental (Grundlagenforschung)

Cite this

Wimmer-Teubenbacher, R., Steinhauer, S., von Sicard, O., Magori, E., Siegert, J., Gspan, C., ... Köck, A. (2015). Gas Sensing Characterisation of CMOS Integrated Nanocrystalline SnO2 – Au Thin Films. In Materials Today : Proceedings; 2(8) (pp. 4295-4301). Elsevier B.V.. https://doi.org/10.1016/j.matpr.2015.09.016

Gas Sensing Characterisation of CMOS Integrated Nanocrystalline SnO2 – Au Thin Films. / Wimmer-Teubenbacher, Robert; Steinhauer, Stephan; von Sicard, O.; Magori, E.; Siegert, Jörg; Gspan, Christian; Grogger, Werner; Köck, Anton.

Materials Today : Proceedings; 2(8). Elsevier B.V., 2015. p. 4295-4301.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Wimmer-Teubenbacher, R, Steinhauer, S, von Sicard, O, Magori, E, Siegert, J, Gspan, C, Grogger, W & Köck, A 2015, Gas Sensing Characterisation of CMOS Integrated Nanocrystalline SnO2 – Au Thin Films. in Materials Today : Proceedings; 2(8). Elsevier B.V., pp. 4295-4301, International Conference Functional Integrated Functional nano Systems, Graz, Austria, 3/12/14. https://doi.org/10.1016/j.matpr.2015.09.016
Wimmer-Teubenbacher R, Steinhauer S, von Sicard O, Magori E, Siegert J, Gspan C et al. Gas Sensing Characterisation of CMOS Integrated Nanocrystalline SnO2 – Au Thin Films. In Materials Today : Proceedings; 2(8). Elsevier B.V. 2015. p. 4295-4301 https://doi.org/10.1016/j.matpr.2015.09.016
Wimmer-Teubenbacher, Robert ; Steinhauer, Stephan ; von Sicard, O. ; Magori, E. ; Siegert, Jörg ; Gspan, Christian ; Grogger, Werner ; Köck, Anton. / Gas Sensing Characterisation of CMOS Integrated Nanocrystalline SnO2 – Au Thin Films. Materials Today : Proceedings; 2(8). Elsevier B.V., 2015. pp. 4295-4301
@inproceedings{e3a3ea611ad34f47a792cac47619765a,
title = "Gas Sensing Characterisation of CMOS Integrated Nanocrystalline SnO2 – Au Thin Films",
author = "Robert Wimmer-Teubenbacher and Stephan Steinhauer and {von Sicard}, O. and E. Magori and J{\"o}rg Siegert and Christian Gspan and Werner Grogger and Anton K{\"o}ck",
note = "Materials Today: nanoFIS 2014 - Functional Integrated nanoSystems",
year = "2015",
doi = "10.1016/j.matpr.2015.09.016",
language = "English",
pages = "4295--4301",
booktitle = "Materials Today : Proceedings; 2(8)",
publisher = "Elsevier B.V.",
address = "Netherlands",

}

TY - GEN

T1 - Gas Sensing Characterisation of CMOS Integrated Nanocrystalline SnO2 – Au Thin Films

AU - Wimmer-Teubenbacher, Robert

AU - Steinhauer, Stephan

AU - von Sicard, O.

AU - Magori, E.

AU - Siegert, Jörg

AU - Gspan, Christian

AU - Grogger, Werner

AU - Köck, Anton

N1 - Materials Today: nanoFIS 2014 - Functional Integrated nanoSystems

PY - 2015

Y1 - 2015

U2 - 10.1016/j.matpr.2015.09.016

DO - 10.1016/j.matpr.2015.09.016

M3 - Conference contribution

SP - 4295

EP - 4301

BT - Materials Today : Proceedings; 2(8)

PB - Elsevier B.V.

ER -